Electrical performance and thermal stability of MIC poly-Si TFTs improved using drive-in nickel induced crystallization

✍ Scribed by Ming-Hui Lai; Yew Chung Sermon Wu; Chih-Pang Chang

• Book ID: 113784020
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 868 KB
• Volume: 126
• Category: Article
• ISSN: 0254-0584
• DOI: 10.1016/j.matchemphys.2010.12.009