Electrical measurement of resistivity fluctuations associated with striations in silicon crystals

✍ Scribed by Burtscher, J.; Dorendorf, H.W.; Krausse, J.

• Book ID: 114590502
• Publisher: IEEE
• Year: 1973
• Tongue: English
• Weight: 510 KB
• Volume: 20
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1973.17731