๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Electrical instability of polymer thin-film transistors using contact film transfer methods

โœ Scribed by Wei, Qingshuo; Tajima, Keisuke; Hashimoto, Kazuhito

Book ID
121216618
Publisher
American Institute of Physics
Year
2010
Tongue
English
Weight
440 KB
Volume
96
Category
Article
ISSN
0003-6951

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Low-frequency noise in polymer thin-film
Low-frequency noise in polymer thin-film transistors
โœ Marinov, O.; Deen, M.J.; Yu, J.; Vamvounis, G.; Holdcroft, S.; Woods, W. ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› The Institution of Electrical Engineers ๐ŸŒ English โš– 438 KB
Origin of bias stress induced instabilit
Origin of bias stress induced instability of contact resistance in organic thin film transistors
โœ Y. Yan; X.J. She; H. Zhu; S.D. Wang ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 606 KB

We report a study on the contact resistance instability induced by the bias stress in staggered pentacene thin film transistors, combining the bias stress measurements with the transfer line method. The contact resistance is increasing with the stress time, and two device parameters are found to con