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Electrical fluctuations in normal metal point-contacts

✍ Scribed by I.K. Yanson; A.I. Akimenko; A.B. Verkin

Publisher
Elsevier Science
Year
1982
Tongue
English
Weight
318 KB
Volume
43
Category
Article
ISSN
0038-1098

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πŸ“œ SIMILAR VOLUMES

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In high ohmic pressure-type metallic point contacts (resistance range 50 Q to 3 kQ) the point-contact resistance is observed to switch randomly between two or more discrete levels. This effect can be explained by the motion or reorientation of single defects, thereby changing their cross section for

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We present studies of the role of charge fluctuations in transport through a quantum point contact (QPC). Our model of QPC is based on assumption of a specific electronic energy structure with a resonant level below the electronic sub-band. We show that charge fluctuations lead to a dynamical Coulom