๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Electrical characterization of Ni/n-ZnO/p-Si/Al heterostructure fabricated by pulsed laser deposition technique

โœ Scribed by Chand, Subhash; Kumar, Rajender


Book ID
125483777
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
436 KB
Volume
613
Category
Article
ISSN
0925-8388

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Fabrication and characterization of NiO/
โœ R.K. Gupta; K. Ghosh; P.K. Kahol ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 534 KB

Transparent and conducting ZnO and NiO films were used for fabrication of p-n junction by pulsed laser deposition. These films were characterized by X-ray diffraction (XRD), atomic force microscopy, UV-visible spectroscopy, and electrical techniques. XRD shows that ZnO films are highly orientated al