Electrical characterization of MOS memory devices containing metallic nanoparticles and a high-k control oxide layer

✍ Scribed by Ch. Sargentis; K. Giannakopoulos; A. Travlos; D. Tsamakis

• Book ID: 108279453
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 477 KB
• Volume: 601
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/j.susc.2006.11.064