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Electrical characterization of interface states in Ni/n-Si(111) Schottky diodes from (C-V) characteristics

✍ Scribed by P.P. Sahay; M. Shamsuddin; R.S. Srivastava

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 387 KB
Volume: 23
Category: Article
ISSN: 0026-2692
DOI: 10.1016/0026-2692(92)90129-o

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