Electrical characterization of deep levels existing in fully implanted and rapid thermal annealed p+n InP junctions

✍ Scribed by L. Quintanilla; S. Duen~as; E. Casta´n; R. Pinacho; R. Pela´ez; J. Barbolla

• Book ID: 110269997
• Publisher: Springer US
• Year: 1999
• Tongue: English
• Weight: 185 KB
• Volume: 10
• Category: Article
• ISSN: 0957-4522
• DOI: 10.1023/a:1008913927240