✦ LIBER ✦
Deep level defects and reverse leakage current of B F2+-implanted shallow p+ n junctions after rapid thermal annealing
✍ Scribed by T.Q. Zhang; J.L. Liu; Z.Y. Zhou
- Book ID
- 113281985
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 353 KB
- Volume
- 59-60
- Category
- Article
- ISSN
- 0168-583X
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