Electrical characteristics of poly-Si TFT's with smooth surface roughness at oxide/poly-Si interface

✍ Scribed by Byung-Hyuk Min; Cheol-Min Park; Min-Koo Han

• Book ID: 114537052
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 73 KB
• Volume: 44
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.641379