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Electric-field-induced resistance switching universally observed in transition-metal-oxide thin films

✍ Scribed by Hamaguchi, M.; Aoyama, K.; Asanuma, S.; Uesu, Y.; Katsufuji, T.

Book ID: 121659549
Publisher: American Institute of Physics
Year: 2006
Tongue: English
Weight: 408 KB
Volume: 88
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2193328

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