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Electric field affects the charge state in ion-implanted Si-SiO2structures

✍ Scribed by A. P. Baraban; L. V. Miloglyadova; V. I. Ter-Nersesyants


Book ID
110126239
Publisher
SP MAIK Nauka/Interperiodica
Year
2001
Tongue
English
Weight
42 KB
Volume
27
Category
Article
ISSN
1063-7850

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