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Elastic scattering in EELS-fundamental corrections to quantification

โœ Scribed by A.J. Bourdillon; W.M. Stobbs


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
226 KB
Volume
17
Category
Article
ISSN
0304-3991

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A new method for non-destructive quantitative analysis of surface nanostructures was developed in recent years. It relies on analysis of the XPS peak shape and usually the e โ€ ects of elastic electron scattering are neglected in practical applications of the method. In the present paper we study the