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Elastic and inelastic contributions to the XPS photoelectron diffraction patterns of Ni(100) and NiO(100)

✍ Scribed by P. Steiner; Th. Straub; Fr. Reinert; R. Zimmermann; S. Hüfner


Book ID
118366597
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
1023 KB
Volume
291
Category
Article
ISSN
0039-6028

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