The structure of thin NiO(100) films grown on Ni(100) as determined by low-energy-electron diffraction and scanning tunneling microscopy

✍ Scribed by M. Bäumer; D. Cappus; H. Kuhlenbeck; H.-J. Freund; G. Wilhelmi; A. Brodde; H. Neddermeyer

• Publisher: Elsevier Science
• Year: 1991
• Weight: 153 KB
• Volume: 253
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(91)90380-a