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Effects of working pressure on morphology, structural, electrical and optical properties of a-InGaZnO thin films

โœ Scribed by Anup Thakur; Se-Jun Kang; Jae Yoon Baik; Hanbyeol Yoo; Ik-Jae Lee; Han-Koo Lee; Seonghoon Jung; Jaehun Park; Hyun-Joon Shin

Book ID
119322444
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
933 KB
Volume
47
Category
Article
ISSN
0025-5408

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๐Ÿ“œ SIMILAR VOLUMES

Effects of morphology on the electrical
Effects of morphology on the electrical and optical properties of thin bismuth films
โœ T. M. Christensen; D. I. Dalton ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 701 KB

## Abstract Thin films of bismuth were evaporated onto polished Si(100) substrates at substrate growth temperatures which varied between 25 and 100ยฐ C. The variations in film morphology observed using the scanning electron microscope and atomic force microscope were compared to changes in the optic