Effects of Total Dose Irradiation on Single-Event Upset Hardness

✍ Scribed by Schwank, J.R.; Shaneyfelt, M.R.; Felix, J.A.; Dodd, P.E.; Baggio, J.; Ferlet-Cavrois, V.; Paillet, P.; Hash, G.L.; Flores, R.S.; Massengill, L.W.; Blackmore, E.

• Book ID: 120209695
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 444 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2006.877896