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Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks

✍ Scribed by E. Miranda; J. Martin-Martinez; E. O’Connor; G. Hughes; P. Casey; K. Cherkaoui; S. Monaghan; R. Long; D. O’Connell; P.K. Hurley

No coin nor oath required. For personal study only.

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