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Effects of the diffused impurity profile on the DC characteristics of VMOS and DMOS devices

✍ Scribed by d'Avanzo, D.C.; Combs, S.R.; Dutton, R.W.

Book ID: 119797622
Publisher: IEEE
Year: 1977
Tongue: English
Weight: 718 KB
Volume: 12
Category: Article
ISSN: 0018-9200
DOI: 10.1109/jssc.1977.1050914

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Striations were observed on nickel heated in 'uacuo at 900°C. The distribution of striating orientations suggests the presence of point cusps in the plot of surface free energy at (loo), ( 110) and (210) orientations and a line cusp between (410) and (510). Also evidence was found that surface diffu