Dependence of 1โจ noise in CrSi2 films on
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J. Belan; V. Mikolaj; J. Valicek; K. Bok
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Article
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1989
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Elsevier Science
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English
โ 223 KB
in chromium silicide films with various values of the temperature coefficient of the resistance was measured. With the value 3 x 1O-6 K-' for the temperature coefficient of the resistance, R-' (dR/dT), l/f noise was higher than with the value 35 x 10d6 K-'. This is in disagreement with the theory of