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Effects of surface relaxation on convergent-beam electron diffraction analysis of stress in silicon

โœ Scribed by A. BENEDETTI; H. BENDER; A. LAUWERS; C. TORREGIANI; K. MAEX


Book ID
108864224
Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
169 KB
Volume
223
Category
Article
ISSN
0022-2720

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