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Comparison of convergent beam electron diffraction and geometric phase analysis for strain measurement in a strained silicon device

โœ Scribed by D. DIERCKS; G. LIAN; J. CHUNG; M. KAUFMAN


Book ID
108866863
Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
291 KB
Volume
241
Category
Article
ISSN
0022-2720

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