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Effects of surface perturbations on the quality and the focused-beam excitation of microsphere resonance

โœ Scribed by Barton, John P.

Book ID
115388709
Publisher
Optical Society of America
Year
1999
Tongue
English
Weight
158 KB
Volume
16
Category
Article
ISSN
1084-7529

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Effects of focused ion beam milling on the compressive behavior of directionally solidified micropillars and the nanoindentation response of an electropolished surface
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Focused ion beam (FIB) milling is the typical method used to fabricate micropillars to study small-scale plasticity and size effects in uniaxial compression. However, FIB milling can introduce defects into the milled pillars. To investigate the effects of FIB damage on mechanical behavior, we tested