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Effects of recovery annealing on reliability of SrBi2Ta2O9based ferroelectric memory devices

โœ Scribed by June-Mo Koo; Jiyoung Kim; Eun-Gu Lee


Book ID
110340038
Publisher
Springer
Year
2002
Tongue
English
Weight
114 KB
Volume
21
Category
Article
ISSN
0261-8028

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