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Effects of Rare-Earth Oxides on the Reliability of X7R Dielectrics

✍ Scribed by Sakabe, Yukio; Hamaji, Yukio; Sano, Harunobu; Wada, Nobuyuki


Book ID
126898678
Publisher
Institute of Pure and Applied Physics
Year
2002
Tongue
English
Weight
738 KB
Volume
41
Category
Article
ISSN
0021-4922

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