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Effects of plasma induced charges on thin oxide of CMOS technologies

✍ Scribed by Gilles Reimbold

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 682 KB
Volume: 27
Category: Article
ISSN: 0026-2692
DOI: 10.1016/0026-2692(95)00101-8

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