Effects of nuclear radiation on a high-reliability silicon power diode—4. Analysis of reverse bias characteristics : J. F. Been. N.A.S.A. Cleveland, NASA-TN-D-7423 (Oct. 1973)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 123 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90334-0