Effects of nuclear radiation on a high-reliability silicon power diode three-junction capacitance : J. F. Been and I. T. Myers. Nat. Aeronaut. Space Admin., Washington D.C., U.S.A., May (1971), pp. 19. P-176474. NASA-TN-D-6330

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 107 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(72)90666-x