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Effects of lateral confinement on the growth of CoSi and CoSi2 on (0 0 1)Si inside 0.2–2 μm oxide openings prepared by electron beam lithography

✍ Scribed by J.Y Yew; L.J Chen; W.F Wu


Book ID
114194697
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
401 KB
Volume
61
Category
Article
ISSN
0254-0584

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