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Effects of interfacial charge on the electron affinity, work function, and electrical characteristics of thinly oxidized semiconductor-insulator-semiconductor and metal-insulator-semiconductor devices

✍ Scribed by Ghosh, Amal K.; Feng, Tom; Haberman, Joel I.; Maruska, H. Paul


Book ID
119955452
Publisher
American Institute of Physics
Year
1984
Tongue
English
Weight
560 KB
Volume
55
Category
Article
ISSN
0021-8979

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