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Effects of interface modification by H2O2 treatment on the electrical properties of n-type ZnO/p-type Si diodes

โœ Scribed by Guan-Ru He; Yow-Jon Lin; Hsing-Cheng Chang; Ya-Hui Chen


Book ID
118501988
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
714 KB
Volume
525
Category
Article
ISSN
0040-6090

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