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Effects of insulator thickness fluctuations on MNOS charge storage characteristics

โœ Scribed by Chou, N.J.; Aboaf, J.A.; Hammer, R.; Crowder, H.P.


Book ID
114590237
Publisher
IEEE
Year
1972
Tongue
English
Weight
793 KB
Volume
19
Category
Article
ISSN
0018-9383

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