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Effects of high-temperature annealing on electron spin resonance in SiOx films prepared by R. F. sputtering system

✍ Scribed by A.M.A. Shamekh; N. Tokuda; T. Inokuma


Book ID
116672551
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
801 KB
Volume
357
Category
Article
ISSN
0022-3093

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