Effects of Guard Bands and Well Contacts in Mitigating Long SETs in Advanced CMOS Processes

✍ Scribed by Narasimham, Balaji; Bhuva, Bharat L.; Schrimpf, Ronald D.; Massengill, Lloyd W.; Gadlage, Matthew J.; Holman, W. Timothy; Witulski, Arthur F.; Robinson, William H.; Black, Jeffrey D.; Benedetto, Joseph M.; Eaton, Paul H.

• Book ID: 126665297
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 933 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2008.920260