Effects of grain-boundary trapping-state energy distribution on the activation energy of resistivity of polycrystalline-silicon films : Chih-Yuan Lu, Nicky Chau-Chun Lu and Chi-Shun Wang. Solid St. Electron.27, 463 (1984)

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 124 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90160-x