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Effects of gas flow rate on the etch characteristics of a low-ksicoh film with an amorphous carbon mask in dual-frequency CF4/C4F8/Ar capacitively-coupled plasmas

โœ Scribed by Bong-Soo Kwon, Hea-Lim Lee, Nae-Eung Lee, Chang-Young Kim, Chi Kyu Choi


Book ID
119937344
Publisher
The Korean Physical Society
Year
2013
Tongue
English
Weight
346 KB
Volume
62
Category
Article
ISSN
0374-4884

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