Effects of fluorine implants on induced charge components in gate-oxides under constant-current Fowler-Nordheim stress

✍ Scribed by Tan Khai Nguyen; Landsberger, L.M.; Jean, C.; Logiudice, V.

• Book ID: 114536941
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 283 KB
• Volume: 44
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.622598