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Effects of epitaxial films of nanometric thickness on the X-ray photoelectron diffraction intensities from substrates

✍ Scribed by A. Atrei

Book ID
119235560
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
586 KB
Volume
185
Category
Article
ISSN
0368-2048

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The effects of photoelectron diffraction
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## Abstract Although not discussed in most reviews of quantitative x‐ray photoelectron spectroscopy (XPS), diffraction of the photoelectrons leaving a single crystal can lead to potential errors of a factor of two or more in the calculated surface composition. A series of experimental measurements