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Effects of electron trapping on diffusion time-of-flight measurement in GaAs

✍ Scribed by H.Z Fardi

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 593 KB
Volume: 38
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(94)00301-u

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