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Effect of carrier-injection width on the time-of-flight measurement

✍ Scribed by Jiang-Huai Zhou; Tatsuo Shimizu


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
320 KB
Volume
88
Category
Article
ISSN
0038-1098

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Effect of field-ionization dynamics on t
✍ J.L. Persson; R.L. Whetten πŸ“‚ Article πŸ“… 1988 πŸ› Elsevier Science 🌐 English βš– 445 KB

Ion time-of-flight lineshapes are found to be drastically altered by the process of tunneling field ionization in the case of nearthreshold photoionization. The delay-time distributions observed correspond directly to the times for tunneling through the fieldionization barrier. Using this effect, fi