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Effects of bias voltage and annealing on the structure and mechanical properties of WC0.75N0.25 thin films

✍ Scribed by Y.D. Su; C.Q. Hu; M. Wen; C. Wang; D.S. Liu; W.T. Zheng

Book ID: 116605316
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 800 KB
Volume: 486
Category: Article
ISSN: 0925-8388
DOI: 10.1016/j.jallcom.2009.06.147

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