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Effects of applied bias voltage in tunnel junctions with ferroelectric barrier

✍ Scribed by L.B. Zhang; M.H. Tang; J.C. Li; Y.G. Xiao

Book ID: 113916070
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 449 KB
Volume: 68
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2011.09.005

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