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Effects of annealing temperature on the carrier concentrations, the carrier mobilities and the quality of nitrogen doped ZnO films deposited by magnetron sputtering

✍ Scribed by Jongmin Lim; Kyoungchul Shin; Chongmu Lee


Book ID
111590326
Publisher
Springer
Year
2004
Tongue
English
Weight
107 KB
Volume
39
Category
Article
ISSN
0022-2461

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