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Effects of annealing temperature and interfacial oxide thickness on layer exchange metal-induced crystallization

✍ Scribed by Jaewoo Shim; Myung-Hoon Lim; Seong-Guk Jeong; Jin-Hong Park

Book ID
119936885
Publisher
The Korean Physical Society
Year
2012
Tongue
English
Weight
191 KB
Volume
60
Category
Article
ISSN
0374-4884

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