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Effects of accelerated temperature testing on the low-frequency noise of planar NPN transistors

✍ Scribed by N.D. Stojadinović

Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 178 KB
Volume: 23
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(83)91017-x

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