Effects of accelerated temperature testing on the low-frequency noise of planar NPN transistors : N. D. Stojadinovic. Microelectron. Reliab.23 (5), 899 (1983)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 132 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90235-x