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Effective V-F characteristics in submicrometre GaAs MESFETs evaluated by ensemble Monte Carlo simulation

✍ Scribed by Yamada, Y.

Book ID: 118015784
Publisher: The Institution of Electrical Engineers
Year: 1994
Tongue: English
Weight: 206 KB
Volume: 30
Category: Article
ISSN: 0013-5194
DOI: 10.1049/el:19940221

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