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Effect on nitrogen profile on electrical characteristics of ultrathin SiO2 films nitrided by RTP

โœ Scribed by P. Letourneau; A. Harb; M. Dutoit; J. Solo de Zaldivar


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
200 KB
Volume
15
Category
Article
ISSN
0167-9317

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