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Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction

✍ Scribed by Q. Chen; W.G. Mao; Y.C. Zhou; C. Lu

Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 868 KB
Volume: 256
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2010.05.071

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