## Abstract The growth of ultraβthin TaβN films using atomic layer deposition (ALD) is investigated by inβsitu Xβray photoelectron spectroscopy (XPS) starting from the first precursor pulse, as precursor substances __tert__βbutylimidoβtris(diethylamido)tantalum (TBTDET) and __tert__βbutylimidoβbis(
Effect of wet chemical substrate pretreatment on the growth behavior of Ta(N) films deposited by thermal ALD
β Scribed by S. Strehle; H. Schumacher; D. Schmidt; M. Knaut; M. Albert; J.W. Bartha
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 455 KB
- Volume
- 85
- Category
- Article
- ISSN
- 0167-9317
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